CORRELATED ELECTRICAL AND MICROSTRUCTURAL STUDIES OF RECRYSTALLIZED SILICON THIN FILMS ON BULK GLASS SUBSTRATES

Contributors:   D.K. Biegelsen, N.M. Johnson, Robert J. Nemanich, M.D. Moyer, and L.E. Fennell

ABSTRACT

Publisher: Materials Research Society Symposium Proceedings,   Volume: 4,   331-336 ||  Published: 1982-01 ||   Read more...