Secondary electron emission of chemical-vapor-deposited diamond by impact of slow H+, D+, H+2, C+, O+, and O+2 ions
Contributors: M. Wieser, P.Wurz, and Robert J. Nemanich
ABSTRACT
We report on the measurements of the secondary electron yield of chemical-vapor-deposited diamond upon the reflection of primary H+, D+, H+2, C+, O+, and O+2 ions in an energy range of 50–1000 eV per atom at a 60° angle of incidence to the surface normal. Depending on the species and energy, a secondary electron yield between 0.1 and 2 was observed and remained unchanged over weeks without further periodic reconditioning of the surface and in spite of the moderate vacuum environment of 10−7mbar. Semiempirical fit functions were found with a dependence on the inverse velocity and the square root of the atomic number of the projectiles.